TY  - JOUR

T1  - Mapping microstructure in ac and psc testpieces deformed at high temperature

JO  - Computer Methods in Materials Science

UR  - https://doi.org/10.7494/cmms.2007.4.0182

PY  - 2007/01/01

AU  - Roebuck B

AU  - Mingard KP

AU  - Brooks M

AU  - Palmiere EJ

AU  - Wynne BP

AU  - Thomas MJ

ED  - 

DO  - DOI: 10.7494/cmms.2007.4.0182

PB  - AGH University Press

SP  - 406

EP  - 415

Y2  - 2025/05/12

ER  -