TY  - JOUR

T1  - Random Strain Fluctuations as Dominant Disorder Source for High-Quality On-Substrate Graphene Devices

JO  - Physical Review X

PY  - 2014/01/01

AU  - Couto NJG

AU  - Costanzo D

AU  - Engels S

AU  - Ki D-K

AU  - Watanabe K

AU  - Taniguchi T

AU  - Stampfer C

AU  - Guinea F

AU  - Morpurgo AF

ED  - 

DO  - DOI: 10.1103/physrevx.4.041019

PB  - American Physical Society (APS)

VL  - 4

IS  - 4

Y2  - 2025/06/26

ER  -